Chapter 3
DS3 Test Commands
Description of DS3 test commands
44
CT-650 Command-Line Reference Guide
Release 9.4
– Allocation of RTUs is performed as follows:
– If requesting a dual-FAD connection, the CT-650 allocates both
DT3 Test Card RTUs to the DCS.
– If requesting a single-FAD connection is requested, the CT-650
allocates an available RTU to the specified DCS. If another
single-FAD test is running, the CT-650 attempts to allocate
both RTUs on the same DT3 test card before using additional
RTUs.
Example
The following command monitors a DS3 signal from the 3ECS3
system, and digroup 111. The test name is test234 and log file log234.
The test uses auto framing and continuous test duration.
Monitor 3ecs3 111 test234 log234 auto continuous
Tx_X_Bit
Sets the transmission of X-bits from the RTU in the M13 or C-bit
framing modes.
Syntax
Tx_X_Bit <
> <
Remarks
– If you do not specify
x_bits
, the CT-650 uses the value
appearing in the
Information Configure Defaults DS3
screen.
– X-BITS can only be manipulated when the RTU idle condition is
set for IDLE mode.
Example
The following command transmits X-bits that emulate the received
signal from the connected side.
Tx_x_bit connected emulate
Summary of Contents for CT-650
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