Software control: Microscope Control
3-12
User Manual
C O N F I D E N T I A L –
limited rights
Feb 2018
Revision A
Full Frame (Ctrl + M)
This is the default scanning mode. It is typical for navigation and imaging.
Spot (Ctrl + K)
When starting this mode, the actual beam position is represented by a green cross in all imaging displays. You can
click on & drag it, or click anywhere around the screen, to change its position.
Line
In this mode, the green horizontal line is shown in all imaging displays. The beam scans along this line. You can
click on & drag it, or click anywhere around the screen to change its position.
External
switches to activate external control of the scanning system, such as an EDX system beam control.
The external scanning mode is indicated by the
External
label shown in the upper right corner of all
imaging displays.
Beam Blank (Ctrl + B)
If its functionality is active, this is indicated by the icon next the scan menu item. It deflects the beam off-axis, high
in the column, and protects the specimen from unnecessary exposure. Selecting the item again releases the
blanker and returns the beam to scanning the specimen.
Slow / Fast Scan (Ctrl + Shift + , / .)
brings the scanning condition to the preset Slow / Fast scan value (see the Preferences / Scanning section).
Slower / Faster Scan (Ctrl + , / .)
sets the scanning condition to the next preset Slower (-) / Faster (+) value (see the
Preferences / Scanning
section).
The adjuster shows the actual dwell time, but does not enable directly editing its value. The value can be selected
from the drop-down list (see the Preferences / Scanning section).
Mains Lock
When ticked, the scanning (line sawtooth signal) is synchronized with the mains AC oscillation. This greatly
diminishes blurring and jittering of the electron imaging, resulting in smooth image edges at higher magnifications
and slow scan conditions.
Line Integration
With this function, each line scan is repeated several times (from 2 to
255) before proceeding to the next line. Signal data collected from these
passes are integrated and shown as an actual image line.
This imaging method reduces sample charging (in comparison with a single
pass with a longer dwell time) and improves the overall image quality.
Scan Interlacing
This function splits an imaging area into a large number of blocks defined
by the number of lines (from 2 to 8). The first line of each block is scanned,
followed by the second one, etc. This imaging method significantly
reduces sample charging.
Note
These two functions cannot run simultaneously. When any of them is active, it is indicated in the toolbar dwell time adjuster
by the letters LI / SI. Its status is also depicted next to the Scan menu / Line Integration or Scan Interlacing item within the
brackets.
Live
is the default mode, leaving the imaging unfiltered for collecting raw direct images. One frame follows another.
Average
Filter continuously averages a specified number (2 or more) of frames, resulting in a better signal-to-noise ratio.
This process continues until stopped by changing the scanning condition or by pausing the imaging.
This is used mostly for fast scanning to reduce imaging noise. During averaging, the image is updated continuously,
and actions such as focusing, moving the stage, etc., can still be performed.
Note
The Average is also set independently for the optical window, but using averaging with more than 4 frames is not
recommended, especially when moving the stage.
