MI 3321 MultiservicerXA
All tests operating mode
164
<
Sub Leakage-S
>, Substitute leakage current, Class II parts.
<
Leakage
>, Differential leakage current.
<
Touch Leakage
>, Touch leakage current.
<
Polarity test
>, Polarity of IEC cords.
<
Clamp current
>, Load and leakage currents with current clamp.
<
RCD test
>, Tests of portable and standard residual current devices.
<
PRCD test
> Tests of portable residual current devices,
<
Functional test
>, Functional inspection.
<
HV-test
>, High Voltage tests.
<
Zl (L-N)
>, Line impedance tests.
<
Zs (L-Pe)
>, Loop impedance tests.
<
Voltage
>, Voltage, frequency and rotary field tests.
<
Discharging time
>, Discharging time tests.
<
Power
>, Measurement of device power consumption.
ENTER
Enters selected test.
ESC
Returns to Main menu.
Note:
Unlike in PAT testing mode all single test results and parameters can be stored for
documentation purposes (view
chapter 12.1
for more information).
11.1.1 Visual test
Descriptions in chapters
9.2.1 Visual test and 10.2.1 Visual test
can be used as
reference.
11.1.2 Continuity of protective conductors
Descriptions in chapters
9.2.2 Continuity and 10.2.2. Continuity
can be used as
reference.
11.1.3 Insulation resistance
Descriptions in chapters
6.2.2 Insulation resistance
,
9.2.3 Insulation resistance
and
10.2.3. Insulation resistance
can be used as reference.
11.1.4 Insulation resistance –S
Description in chapter
6.2.3 Insulation resistance-S
can be used as reference.
11.1.5 Substitute leakage current
Description in chapter
6.2.4 Substitute leakage currents
can be used as reference.
