MI 3321 MultiservicerXA
Machine testing operating mode
131
RCD test menu
Test parameters for RCD test and measurement
TEST
RCD
sub-function
test [Tripout time - RCDt, Uc, AUTO, Tripout current].
Idn
Rated
RCD residual current sensitivity
I
N
[10 mA, 30 mA, 100 mA, 300
mA, 500 mA, 1000 mA].
Multi
Multiplier
of Idn [½, 1, 2, 5].
Type
RCD
type
[AC, A, B*, AC_S, A_S, B_S*]
Phase
Starting
phase
[(+), (-)].
The instrument is intended for testing of general (non-delayed) and
S
elective (time-
delayed) RCDs, which are suited for:
-
Alternating residual current (AC type),
-
Pulsating residual current (A type).
-
DC residual current (B type)*
* Instrument HW version 3.0 or higher
Time delayed RCDs have delayed response characteristics. The contact voltage pre-
test can influence the trip out time of time delayed RCDs therefore a delay of 30 s is
inserted before performing the trip-out test.
