Oxford Instruments Cypher SPM, Руководство пользователя

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Cypher SPM
User Guide
10.1.4 Applying sample bias or ground
1. Sample mounting.
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Mount your sample onto the Electrical Sample Puck
Assembly (448.140) using silver paint or some other
conductive adhesive.
2. Never load non-flat samples into the ES scanner.
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Unlike the S scanner, the ES scanner cannot accept
non-flat samples. A non-flat sample is any sample in
which the region to be scanned is not the tallest fea-
ture on the sample puck. For example, the sample
shown on the left has a magnet glued to the puck
that is taller than the sample.
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Given the low profile of the ES cantilever holders, it is
not possible to engage on the sample shown on the
left since the magnet would hit the cantilever holder
before the cantilever engaged on the sample.
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For electrical measurements, use the low-profile elec-
trical sample puck (as shown on the right) provided
in the accessory kit.
Attempting to starting a tip
approach on a “non-flat” sample
may cause serious damage to your
cantilever holder and sample stage.
3. Sample BIAS connection.
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Insert the sample puck as shown.
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Use blunt tipped tweezers to connect the wire as
shown to the FRONT connection. This applies a
sample bias.
Tip: Lower the cell body to get more sample access
by rotating the Engage Control Knob coun-
terclockwise until it reaches its lower limit of travel.
Page 67 of 243 10 Cell Body and Sample Stage Guide