MOD E L 3562A
S E RV I C E
D . Effective Sample Rate Generator Test
Use tab le A1 -4 to verify the components in the effective sam ple rate generator. I n table
A 1-4, a
'
0
'
represents a TTL level low and a '1 ' represents a TTL level high. Set the frequency
span by pressing the H P 3562A keys as fol lows:
FREQ
FREQ
SPAN
. . . . . . To freq uency span in table
Table AI-4 Effective Sample Rate Generator Test
Frequency Span
DA
DB
DSE l
TP1 2
(U1-3)
(U4-12)
(U101-2)
1 kHz
0
0
1
25.6 kHz
3.125 kHz
0
1
1
80.0 kHz
1 0 kHz
1
0
1
256 k H z
1 00 kHz
1
1
0
5.1 2 MHz
If the fault has not been fou nd, go to part E .
E. Digital Source Signature Analysis Tests
Use these tests and the waveforms in part F to isolate a fai l u re on the digital sou rce
assembly. O n ly the com ponents in the fail i ng subblocks need to be tested.
1 . Press the l ine switch off.
2. Connect the Signature Analyzer as fol lows:
Table A
1-5
OS Signature Analyzer Setup
Signal
Polarity
G round
Clock
Positive edge
Stop
Positive edge
Start
Positive edge
3. Press the line switch on.
Connection
A1 J2-1
A1 J2-3
A1 J2-4
A1 J 2-5
4. To start signature analysis test #1 , press the H P 3562A keys as fol lows:
SPCL
FCTN
. . . . . . S E RVIC
T E ST
. . . . . . LOO P
ON
. . . . . . TEST
SOURC E
SOURCE
MAI N
8-1 5
Содержание 3562A
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