HP 3562A, Руководство по обслуживанию

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FAU LT I SO LAT ION MO D E L 3562A
7-8
7 -6 POWER-UP TESTS
Introduction
The power-up test proced u re is used when there is no display, incorrect d isplay, or the
instrument does not respond when a key is pressed . The i n itial cond itions test (paragraph
7-5) must be completed before perform i ng the power-up test proced u re.
The power-up tests consist of two sets of tests, low-level and high-level. The low-leve l
tests exercise the A2 System CPU, the A3 Program ROM, the A8 G lobal RAM, the global
bus, and the system bus. Fau lt and pass codes for these core assembl ies are d isplayed
using the A2 System CPU test LEDs (A2 DS3, A2 DS4). The high-level power-u p tests exercise
the A9 FFT, A7 FPP, AS DGTL FL TR, and A6 D FL TR CONT assembl ies. Fau lts on these
assembl ies are displayed in the test log (refer to table 7-6 for the description of these
m essages). The instrument performs a calibration if the power-up tests pass.
Power-up test fai l u res may be caused by one of the fol lowing cond itions:
1. A core assem bly is defective (A2, A3, A8).
2. An assembly on the system bus or global bus is defective, causing a bus fai l u re.
3. The A1 5 Keyboard system bus interface circu its are defective. (This may be the
case when the display is normal after power-up but the instru ment does not respond
when a key is pressed.)
4. A control l i ne is defective.
Power-Up Test Procedure
To find the cause of the fai l u re, start by referring to tab le 7-4 for the location of the
A2 Test LEDs and the L E Ds to Hex code translation.
A.
To verify the core assembi ies are operating correctiy, perform steps
i
through 6:
2. l ine switch on.
3. Press the reset switch A2 Si (reset sw itch on A2 CPU).
4. After the reset sw itch is pressed, the A2 System CPU should flash the test L E Ds
(A2 DS3, A2 DS4), I ight the LE Ds one at a ti me, and cyc le through several codes
as l isted in table 7-3. When f i n ished, A2 DS1 should be off.