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4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)
52
Probe Short-Circuit Detection Enable/Disable
1
Open the Basic Settings screen.
2
Open the System screen.
3
Enable or disable the function.
4
(When enabled (ON selected))
Set the probe detection timing.
5
Return to the Measurement screen.
The Basic Settings screen appears.
The System screen appears.
[SYSTEM]
1
Selection
2
Selection
1
2
Disables the function (default)
(go to step 5)
Enables the function
Selection
1
2
Setting range: 1 to 100 ms, 5 ms (default)
Short-circuit detection is delayed for the speci-
fied time following the end of measurement.
3
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
Содержание RM3542
Страница 2: ......
Страница 6: ...Contents iv ...
Страница 16: ...Operating Precautions 10 ...
Страница 26: ...1 3 Screen Organization 20 ...
Страница 32: ...2 3 Turning the Power On and Off 26 ...
Страница 46: ...3 8 Confirming Faulty Measurements 40 ...
Страница 64: ...4 12 Compensating for Thermal EMF Offset Offset Voltage Compensation OVC 58 ...
Страница 84: ...6 4 Auto Exporting Measured Values at End of Measurement Data Output Function 78 ...
Страница 90: ...7 3 Printing 84 ...
Страница 172: ...9 10 Device Compliance Statement 166 ...
Страница 190: ...11 4 Disposing of the Instrument 184 ...
Страница 200: ...Appendix 5 Dimensional Diagram A10 Appendix 5 Dimensional Diagram ...
Страница 214: ...Index Index 4 ...
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