Figure 9-1: Boundary-Scan Register
This figure shows how test data is serially shifted around the periphery of the IEEE Std. 1149.1 device.
TCK
TMS
TDI
TDO
Internal Logic
TAP Controller
Each peripheral
element is either an
I/O pin, dedicated
input pin, or
dedicated
configuration pin.
Boundary-Scan Cells of a Cyclone V Device I/O Pin
The Cyclone V device 3-bit BSC consists of the following registers:
• Capture registers—Connect to internal device data through the
OUTJ
,
OEJ
, and
PIN_IN
signals.
• Update registers—Connect to external data through the
PIN_OUT
and
PIN_OE
signals.
The TAP controller generates the global control signals for the IEEE Std. 1149.1 BST registers (
shift
,
clock
,
and
update
) internally. A decode of the instruction register generates the
MODE
signal.
The data signal path for the boundary-scan register runs from the serial data in (
SDI
) signal to the serial data
out (
SDO
) signal. The scan register begins at the
TDI
pin and ends at the
TDO
pin of the device.
JTAG Boundary-Scan Testing in Cyclone V Devices
Altera Corporation
CV-52009
Boundary-Scan Cells of a Cyclone V Device I/O Pin
9-10
2014.01.10