NXP Semiconductors K22F series, Reference Manual, Page: 1402 / 1407

A.30 EzPort changes
• In "EzPort commands" table, modified footnote in BE row from "Bulk Erase is accepted when security is set and only
when the BEDIS status field is not set," to "Bulk Erase is accepted when the BEDIS status field is not set."
• In "EzPort status register field description," in BEDIS row:
• Modified field description from "Indicates whether bulk erase (BE) is disabled when flash is secure," to "Indicates
whether bulk erase (BE) is disabled."
• Modified first sentence of bit setting description for '1', from "1 = BE is disabled if FS is also set," to "1 = BE is
disabled."
A.31 FlexBus changes
• In Chip Select Control Register (CSCR), made Set/Clear clarifications to bit field RDAH description.
• In "Initializing a chip-select" section, added: Before using any other chip select to take it out of global chip select mode,
you must initialize CS0.
• Basic Read-Bus Cycle, Basic Write-Bus Cycle diagrams: added color.
• All timing diagrams: Added TIP waveform, state variables, and other information. Also added color.
• "Bus errors" section update
A.32 CRC changes
In the "Introduction" section, removed "WAS" from the sentence "The CRC module provides a programmable polynomial,
WAS, and other parameters required to implement a 16-bit or 32-bit CRC standard."
A.33 RNGA chapter changes
• No substantial content changes
A.34 ADC changes
• Editorial changes
• Changed bitfield access of ADC_SC3[CALF] to w1c (write 1 to clear).
EzPort changes
K22F Sub-Family Reference Manual, Rev. 4, 08/2016
1402 NXP Semiconductors