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6 Operation | 6.2 Obtaining a First Image
ZEISS
6.2.7 Optimizing the Image
Once you have generated an initial image, you can adjust various parameters to optimize the im-
age.
Info
The following procedure describes the best way to quickly optimize the image without the
control panel. You can also use the control panel to adjust aperture alignment, magnification/
focus and brightness/contrast.
Overview
The procedure contains the following steps:
§
§
Moving the Field of View at High Magnifications [
§
§
§
§
6.2.7.1 Adjusting the Magnification
1. To switch to the Fine mode, in the
Status Bar
, click
.
à
The
button changes to
.
2. Step by step, raise the magnification up to Mag 50,000 x and focus in between.
To adjust the magnification and the focus, hold down the left mouse button or the mouse
wheel, respectively, and drag the mouse within the
Image Area
.
6.2.7.2 Moving the Field of View at High Magnifications
If you want to move the field of view at high magnifications, use the
Beam Shift
function instead
of moving the stage.
1. In the Crossbeam SEM Control panel, select the Control tab.
2. In the
Alignment
section, click Beam Offset.
3. To shift the beam, in the Beam Offset naviga-
tion box, use the scroll bars or the red marker.
6.2.7.3 Limiting the Scan Field
Prerequisite
ü
Adjusting the size and position of the small frame (reduced raster) requires the license RE-
DUCED.
1. In the
Toolbar
, click the Reduced Raster/Apertures icon.
à
A small scan frame is displayed. This frame defines the specimen area to be scanned by
the electron beam.
à
The image outside the scan frame is frozen.
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Instruction Manual ZEISS Crossbeam 350 | en-US | Rev. 3 | 349500-8111-000