Teseq NSG 3040, Руководство пользователя

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NSG 3040 EMC test system
9.4 Pulse enable/next step input
Between pin 17 (hi) and pin 2, 8, 15, 20 (low)
Input open = inactive; input shorted = active
If this input is activated during a test run the test is halted (exactly the same
as the pause function in the control software). The test will continue to run as
soon as the input is made inactive again.
If the input is already active before a test is implemented then the test cannot
start.
9.5 EUT fail input
Between pin 6 (hi) and pin 2, 8, 15, 20 (low)
Input open = inactive; input shorted = active
This connection serves as a control input that can be activated externally.
The EUT can activate this input if it is capable of reporting a disturbance effect
caused during an EMC test. Such events are time/date stamped by the system
and are stored together with the current test parameters for subsequent use
in a test report if required.
9.6 EUT power off
Between pin 4 (hi) and pin 2, 8, 15, 20 (low)
Input open = Inactive, EUT power is controolled via front panel or WIN
3000 software
Input shorted = Active, in case EUT power is switched on, shorting this
input will set EUT power to off
Notes:
1. Using this function only makes sense if an EUT power contactor is availbale
somewhere in the system. EUT power contactors are available in VAR 3005,
INA 6502, CDN 3061, CDN 3043, CDN 3063.