68
NSG 3040 EMC test system
1.0
0.8
0.5
0.3
0.1
T
2
max 30%
T
T1
t
Front time T1 = 1.25 x T 8 = µs ± 20%
Time to half value: T2 = 20 µs ± 20%
Wave shape of short circuit current (8/20 μs), wave shape definition according
to IEC/EN 61000-4-5.
WARNING - Using improper equipment when measuring
surge pulses can result in personal injury or equipment
damage.
NOTE - Teseq recommends using a Teseq MD 200 or MD
200 A differential probe in combination with a Teseq
INA 3236 Fischer-to-banana adapter for surge pulse
verification.
Содержание NSG 3040
Страница 1: ...1 NSG 3040 EMC TEST SYSTEM USER MANUAL 601 279F ...
Страница 2: ...NSG 3040 EMC test system NSG 3040 EMC TEST SYSTEM USER MANUAL ...
Страница 80: ...80 NSG 3040 EMC test system Explanation of Burst frequency Burst duration and Repetition time parameters ...
Страница 102: ...102 NSG 3040 EMC test system 13 DECLARATION OF CONFORMITY CE ...
Страница 155: ...155 NOTES ...