Teseq NSG 3040, Руководство пользователя

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methods. The EUT is connected to the mains power socket on the front panel
of the test system for the direct mains injection test. Capacitively coupled tests
require the interference to be superimposed onto the signal or data line cables
via an external coupling clamp that is connected to the burst output on the front
panel of the system.
3.2 Combination wave test
The surge test, in compliance with IEC/EN 61000-4-5, duplicates high voltage/
high energy interference as experienced with a lightning strike. Generally speak-
ing the interference finds its way into household equipment via the mains power
supply.
This kind of interference can affect equipment in either of two ways. Firstly, the
interference can be coupled directly into the equipment via the mains supply.
The interference is conveyed directly from the source (e.g. lightning strike to
external power cables). Every item of equipment connected to this power
source will be affected by the interference pulses.
Alternatively, the pulses from the source of the interference or its associated
mains cables can be coupled into other equipment positioned nearby.
Surge pulse interference can also occur on signal and data lines through cou-
pling effects and electrical discharges.
The system enables tests to be carried out using both coupling methods. The
EUT is connected to the mains power socket on the front panel of the test
system for direct mains injection tests. Externally coupled tests require the
interference to be superimposed onto signal/data line cables via an external
coupling unit that is connected to the surge output on the front panel of the
system.
3.3 Mains quality test
The mains quality test includes the simulation of dips and interrupts of the mains
power supply in accordance with IEC/EN 61000-4-11 and for DC power supplies
in accordance with IEC/EN 61000-4-29.
A voltage dip occurs when the supply voltage falls considerably below the