VX1410 IntelliFrame Instruction Manual
3–109
TEST Subsystem
This section describes each command and query in the TEST subsystem. These
commands are used to execute internal self-tests. The TEST subsystem controls
the parameters shown in Figure 3–9.
Figure 3–9: TEST Subsystem Hierarchy
Table 3–19 lists all of the internal self tests of the VX1410 IntelliFrame.
Table 3–19: VX1410 IntelliFrame Self Test
Test Number
Test Name
Execution Time
(Seconds)
Power On Test
Included in
TEST?
Invoked by
TEST:NUMBer?
1000
Fan Speed Control
116
No
Yes
Yes
1010
ADC and DAC Control
< 1
Yes
Yes
Yes
1100
Front Panel Display Control Test 1
25
No
No
Yes
1110
Front Panel Display Control Test 2
36
No
No
Yes
1120
Front Panel Display Control Test 3
6
No
No
Yes
A description of each self test is listed below:
H
Fan Speed Control test. This test varies the fan speed control and verifies
that the fan speed changes accordingly.
H
ADC and DAC Control test. This test verifies the internal ADC and DAC
circuitry.
H
Front Panel Display Control Test 1. This test performs the following
sequences:
a. Turns on all display pixels.
b. Turns off all display pixels.
c.
Writes the character 8 to each display position.
d. Turns on all display pixels.
Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com
