LeCroy SDA, Operator'S Manual

Page: 307 / 397

SDA Operator’s Manual
SDA-OM-E Rev H
307
SDM Capabilities
The capabilities of option SDM are standard in the SDA, so it is not available for purchase for the
SDA. This option is only available for the WaveMaster, WaveRunner 6000A Series, and WavePro
7000A Series of oscilloscopes. SDM adds eye pattern testing to these oscilloscopes.
The option also adds other key components to the basic scope, including JTA2 with its TIE@lvl
parameter. TIE@lvl is a JTA2 measurement that measures the time interval error of the crossing
points of the signal under test and, with option SDM, also includes a golden PLL clock recovery
module that is used for forming the eye pattern without an external trigger. Standard masks are
included with option SDM as indicated in Table 2. Note that not all data rates can be tested with
all oscilloscopes. The analog bandwidth limits the upper data rate that can be tested.
ASDA-J Capabilities
ASDA-J adds several key capabilities to the SDA. In its standard form, the SDA includes eye
pattern testing with mask hit indication; Jitter testing, including jitter bathtub computation and
separation of jitter into its random and deterministic components; as well as the breakdown of
deterministic jitter into periodic, data dependent, and duty cycle distortion.
Option ASDA-J adds the following analysis features:
•
Mask violation location This is the ability to list and view the individual bits that violate the
selected mask. (Mask violation location takes much more time than jitter testing; acquisition
size should be just a few thousand UI.)
•
Filtered jitter Processes the time interval error trend vs. time with a user-selectable band-pass
filter. This feature provides peak-to-peak and rms measurements of the jitter on the filtered
waveform.
•
ISI plot Generates an eye diagram including only those affects from data dependent sources.
The user can select from 3 to 10 bit patterns for this test and can view the contribution from
any individual pattern. The ISI plot is an alternate method for measuring data dependent jitter
when the signal under test does not contain a repeating bit pattern.
•
Bit error test with error map Measures the number of bit errors and error rate on the acquired
waveform by converting the wave shape to a bit stream and comparing the result to a user-
definable reference pattern. The data can be further divided into frames that can be arranged
in a 3-dimensional map with frame number on the Y-axis, bit number on the X-axis, and failed
bits shown in a light color.