Cognex In-Sight 1721, User Manual

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In-Sight
®
1700 Series Wafer Reader Section 7: Native Mode Commands
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7.6.21 EV SetWaferAcqEnable
EV SetWaferAcqEnable(<WafID>,<AcqEnable>)
Disables image acquisition to allow a test read from the last image acquired, or from an
image file, when the wafer reader is Offline. The Light Mode and Light Power settings are
temporarily disabled.
Inputs : WafID, AcqEnable
Outputs : Status Code, # of bytes
Sample Input and Output
EV SETWAFERACQENABLE(A4,0)
1
0
7.6.22 EV SetWaferOrder
EV SetWaferOrder(<WafID>,<Order>)
The order in which enabled Configs will be tried until a successful read can be obtained.
Inputs : WafID, Order
Outputs : Status Code, # of bytes
Sample Input and Output
EV SETWAFERORDER(A4,0)
1
0
7.6.23 EV SetWaferScoreAs100
EV SetWaferScoreAs100(<WafID>, <State>)
Specifies whether character positions fielded as dashes (-), dots (.) and spaces
automatically score 100 points or receive a weighted score based on the quality of the
read. This setting is only available for ‘Chars, SEMI’, ‘Chars, IBM’ and ‘Chars, Triple’
Marks.
Inputs : WafID, State
Outputs : Status Code, # of bytes
Sample Input and Output
EV SETWAFERSCOREAS100(A4,1)
1
0