Cognex In-Sight 1721, User Manual

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In-Sight
®
1700 Series Wafer Reader Section 3: Configuring a Wafer ID Application
3.6 Setting Options
The selections in the Options tab (Figure 3-10) control how the configured wafer ID
application will operate during runtime.
Figure 3-10: Options Tab
3.6.1 Read
Read options control the try sequence for enabled Configs. Optionally, image acquisition
can be disabled to allow test reads from image files when the wafer reader is Offline.
Read Timeout & Read Order
Read Timeout specifies the total amount of time (up to 60 seconds) to allow for a read,
including retries and tuning of enabled Configs. When the timeout limit is reached without
a successful read, the read fails.
NOTE Specifying a Read Timeout differs from terminating the execution of the read using the Abort
Execution command. For more information on this command, refer to Section 7: Native Mode
Commands.
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