Cognex In-Sight 1721, User Manual

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In-Sight
®
1700 Series Wafer Reader Section 3: Configuring a Wafer ID Application
To finish editing the box and accept the changes, double left-click anywhere in the image,
or click the
Save button.
3.5.16 Tune
The Tune button accesses the automated tuning process used to optimize Config
settings (see Figure 3-9). Unlike Retry tuning, standard tuning is performed on an
individual Config prior to runtime.
During tuning, an exhaustive read test is performed on the mark using combinations of
Color, Light Mode, Light Power and Size settings with the current settings for the Mark,
Checksum, Accept, Character Threshold, Field String/Definition, Character Spacing and
Region settings. After each iteration, the string and score results for the last read are
displayed. The best string and score result achieved so far are shown, along with counts
of the total number of reads attempted and the number of successful reads.
NOTES
■ Either the Light or Size checkbox must be enabled to tune the Config.
■ The image display is not updated during tuning.
Figure 3-9: Tuning a Character String
When tuning is completed, the combination of settings that correctly read the mark with
the highest score is retained, and can be applied to the Config or discarded.
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