Hioki RM3542-50, Instruction Manual

Page: 19 / 234

1.1 Product Overview and Features
13
1
Reliable Contact Checks (p. 50)
Contact checking (that was previously performed be-
fore and after measuring) is now performed during
measurement, so probe bounce and contact resistance
fluctuations can be detected. Contact checking time
can be shortened, improving tact times.
Features
Measurement Circuit Strongly Immune to
Contact Resistance Fluctuations
The effects of contact resistance fluctuations are re-
duced even when scattering occurs near the end of
probe life. Such effects are minimized by the fast re-
sponse of the measurement circuit. Contact Improvement Function
(Contact Improver) (p. 52)
The Contact Improver function improves bad contacts
between probes and test samples. Contacts errors are
reduced by penetrating oxidation and impurities be-
tween probes and samples.
Reducing contact errors can increase productivity and
quality. The intensity of the contact improver function
can be adjusted according to probe type.
Reject Faulty Data - Voltage Level Monitor
Function (p. 55)
When the contact resistance of the H
CUR
and L
CUR
leads fluctuates, the measurement current changes
momentarily. Such momentary changes are not detect-
able by typical contact checking.
The Voltage Level Monitor Function indicates a contact
error if the detection voltage changes significantly. It
can enhance the reliability of the measurement value.
Minimize Human Error and Risk
- Settings Monitor Function (p. 59)
If the settings are found to be different after comparing
the setting conditions of two instruments, an alarm is
sounded to prohibit the TRIG input. Helps to prevent
human errors by avoiding setting mistakes.
Reliable Four-Terminal Measurement -
Probe Short-Circuit Detection Function (p.
57)
If a conductive foreign object is present between the
POT and CUR probe tips, the reliable four-terminal
measurements cannot be maintained. When not
measuring, resistance between the POT and CUR
probe tips is measured and short-circuit probe anom-
alies are detected.
Strong Electrical Noise Immunity
The specified measurement accuracy is achieved
even with a ±1.5 kV mixed pulse noise. The floating
measurement section design is highly impervious to
electrical noise, minimizing the effect on measure-
ment values even when turning large-induction mo-
tors on and off.
The free-range power supply input (90 to 264 V) is
essentially unaffected by voltage fluctuations, so sta-
ble measurements are possible even under poor
power conditions.
DUT
Foreign Object
PO
T
CU
R
DUT electrode
Previously
RM3542A
Contact Condition
Contact
Check
Measuring
Probe Bounce
Contact
Condition
Detection
Voltage
Error
Good Contact
Poor Contact
An error occurs
because the detection
voltage changes significantly.
Good Contact
ERROR
Measurement
Contact Check
Contact Condition
Contact Improvement
Function (Contact
Improver)
Contact Improvement
Measuring
Contact Check
ON ON