Hioki RM3542-50, Instruction Manual

Page: 56 / 234

4.5 Checking for Poor or Improper Contact (Contact Check Function)
50
This function detects poor contact between the probes and measuring object, and broken measure-
ment probes.
The instrument continually monitors the resistance between the H
CUR
and H
POT
probes and the
L
CUR
and L
POT
probes from the start of integration (including response time) and while measuring.
When the resistance is outside of the specified value, a contact check fault occurs and the C.E. Hi
or C.E. Lo error message appears. No comparator judgment is applied to the measurement value.
When these error messages appear, check the probe contacts, and check for broken measurement
probes.
(If the error is not cleared by shorting the tips of a known-good measurement probe, the instrument
requires repair.)
• During low-resistance measurement, poor contact of the H
CUR
or L
CUR
probe may be detected as an out-of-
range measurement.
• When contact checking is disabled, measurement values may be displayed even when a probe is not con-
tacting the measuring object.
4.5 Checking for Poor or Improper Contact
(Contact Check Function)
1
Open the Basic Settings screen.
2
Open the Measurement Settings Screen.
3
Enable or disable the function.
4
Select the contact check fault threshold resistance.
The Basic Settings screen appears.
The Measurement Settings Screen
appears.
[MEAS SETTINGS]
1
Selection
2
Selection
1
2
Disables the function (go to step 5).
Enables the function (default).
The setting is specific to the selected range
(p. 43)
Selection
1
2
50
Ω
, 100
Ω
, 150
Ω
, 200
Ω
(default), 300
Ω , 400 Ω , 500 Ω
A contact fault occurs when a measured
value exceeds the threshold setting.