Hioki RM3542-50, Instruction Manual

Page: 58 / 234

4.6 Improving Probe Contact (Contact Improver Function)
52
Probe contacts can be improved by applying current from the POT to the CUR probes before mea-
suring.
The current used for the Contact Improver functions can be selected as follows.
17 mA, 25 mA, 35 mA (default), 50 mA
Higher current provides more effective contact improvement, but at the cost of faster probe deterioration.
Contact Improver current can be set to be disabled (OFF), enabled (ON), or PULSE.
The PULSE setting applies the contact improvement current for approx. 100 µs to 300 µs immediately before
measurement. The PULSE setting is useful to decrease Joule heating of the DUT based on contact improve-
ment current if the measuring object is susceptible to change in characteristics.
*. It takes several microseconds for the DUT current to reach the steady-state value. Until the steady-state
value is reached, a transient current that is approximately equal to the contact improvement current setting
(default setting: 35 mA) will flow.
4.6 Improving Probe Contact
(Contact Improver Function)
The Contact Improver function applies voltage to the sample. Be careful when measuring
samples with characteristics that may be affected.
100 m
Ω
range to 100 k
Ω
range 300 k
Ω
range to 100 M
Ω
range
DUT current
*
2 mA max. 60 mA max.
DUT voltage 20 V max. 15 V max.
Setting Timing chart (Contact Improver Function)
OFF
ON
*Internal delay is different for each range.
Measurement
Start
TRIG
Contact
Improver
current
Probe
Contact
Condition
Measuring
Internal
delay *
Stable Contact
Measurement
Start
TRIG
Contact
Improver
current
Probe
Contact
Condition
Measuring
Internal
delay *
Stable Contact