Hioki RM3542-50, Instruction Manual

Page: 63 / 234

4.9 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)
57
4
Four-terminal measurements are not possible when a conductive for-
eign object is present between the POT and CUR probe tips. To detect
short-circuited probes, this function measures the resistance between
the CUR and POT terminals after a specific time (initially 5 ms) follow-
ing the end of measurement.
Probe short-circuit detection is disabled by default.
When a probe short-circuit is detected, an error message appears on
the measurement screen, and the
PRB_SHORT
and
ERR
signals are
output.
(
ERR:021 Probe short error
)
Short-circuit detection can also be controlled by asserting the active-low PRB_CHECK of the EXT. I/O signal.
Asserting the PRB_CHECK signal while measuring causes short-circuit detection to be performed after the
end of measurement (p. 95).
About Probe Short-Circuit Detection
• If probes are connected to the measuring object during probe short-circuit detection, it is determined as
probe short circuit. Ensure that the probes have sufficient time to separate from the measuring object.
• Probe short-circuit detection occurs within about 1 ms.
• The threshold for probe short-circuit detection is fixed at 500
Ω , so if the resistance between CUR and POT
probes is larger, detection is not possible.
4.9 Test for Short-Circuited Probe
(Probe Short-Circuit Detection Function)
DUT
Foreign Object
POT CU
R
DUT
electrode
Timing chart
(Probe Short-circuit Detection)
Probe short-circuit
PRB_SHORT
Comparator
Hi
,
IN
,
Lo
End of
measurement
EOM
Measurement
Start
TRIG
Measurement
status
Transport
Measurement
stage
DUT1 contact DUT2 contact Transport
Probe short-circuit
Transport
DUT1
measurement
DUT2
measurement
Short-circuit
detection
Detection timing setting
Available
Short-circuit
No judgment