
ML62Q1000 Series User’s Manual
Appendix E. List of Notes
FEUL62Q1000
E-20
See Section 25.4.5.4 "Verifying Specified Flash Memory Area".
[ ] The verify process needs to be completed within 500ms. In the case of verifying multiple addresses,
the process from previous setting data to the next setting data or to the end of initial setting command
transmission (7) within 500ms.
Chapter 26 Code Option
See Section 26.2.1 "Code Options 0 (CODEOP0)".
[ ] Set the WDTSPMD bit to "0".
See Section 26.3 "Code Options 2 (CODEOP2)".
[ ] For the code option data definition, always use the dw directive instruction to configure the data in the
unit of word.
Chapter 27 LCD Driver
See Section 27.2.5 "Segment Mode Register 0 (SEGMOD0)".
See Section 27.2.6 "Segment Mode Register 1 (SEGMOD1)".
See Section 27.2.7 "Segment Mode Register 2 (SEGMOD2)".
See Section 27.2.8 "Segment Mode Register 3 (SEGMOD3)".
See Section 27.2.9 "Segment Mode Register 4 (SEGMOD4)".
[ ] Write the segment mode register when the display stop mode (LMD1 bit and LMD0 bit of DSPCON
register is "0"), prevent erroneous displays or damage of panel.
Chapter 28 On-Chip Debug Function
See Section 28.3 "Precautions".
[ ] Do not connect a component that causes the pin to be fixed to "H" level to the RESET_N pin.
[ ] Do not connect a component to the P00/TEST0 pin.
[ ] Do not program instruction codes into the LSI that set the P00/TEST0 pin to the output mode. If
P00/TEST0 is set to the output mode before EASE1000 performs read/write to/from the target chip,
communication with EASE1000 after that will be disabled. Also note that the input/output mode of
P00/TEST0 is uninitialized by the EASE1000.
[ ] Validate the ROM code on user production board without the EASE1000.
[ ] Disconnect EASE1000 when measuring the current consumption of the target system. If EASE1000
remains connected, the current consumption increases as the on-chip debug circuit inside the LSI works
for the communication.
[ ] When using the 3.3 VOUT power supply of EASE1000, do not apply power of the target system to the
VDD pin of LSI. If both power supplies are connected, EASE1000 may be damaged, or an electric shock
or fire may occur.
[ ] Supply 3.0V to 5.5V to the VDD pin when programming the Flash on the MCU by using the EASE1000.
[ ] LSI used to debug a program is not covered by the product warranty. Do not use the LSI for
mass-production.
[ ] A reset due to unused ROM area access does not occur in the on-chip debug mode regardless of code
option settings.
[ ] A RAM parity error reset does not occur in the on-chip debug mode and the break operation occurs
instead.
[ ] The all interrupts and watchdog timer operation always stop while the debugger is in the break state.
[ ] EASE1000 might be affected by the external environments such as the host PC, USB cable,
EASE1000 interface cable and the target system. Please confirm proper environments before using the
EASE1000.
[ ] If adding an external capacitor to the RESET_N pin, prepare a jumper function on the board so that the
capacitor gets disconnectable when using the DTU8 debugger or Flash multi-writer MWU16.
Chapter 29 Safety Function
See Section 29.3.2 "Unused ROM Area Access Reset Function".
[ ] CSR[3] is unused on the ML62Q1000 series. The data of CSR "0x8 to 0xF" are handled as "0x0 to
0x7".
See Section 29.3.3 "Clock Mutual Monitoring Function".
[ ] For "Overflow value setting" in Figure 29-4, set the value so that the overflow period of the 16-bit timer
n is to be shorter than that of the functional timer n. If the functional timer n overflows, it disables the
accurate check. Be careful to prevent overflow of the functional timer n.
Содержание ML62Q1000 Series
Страница 17: ...Chapter 1 Overview...
Страница 112: ...Chapter 2 CPU and Memory Space...
Страница 154: ...Chapter 3 Reset Function...
Страница 166: ...Chapter 4 Power Management...
Страница 196: ...Chapter 5 Interrupts...
Страница 248: ...Chapter 6 Clock generation Circuit...
Страница 274: ...Chapter 7 Low Speed Time Base Counter...
Страница 291: ...Chapter 8 16 Bit Timer...
Страница 320: ...Chapter 9 Functional Timer FTM...
Страница 382: ...Chapter 10 Watchdog Timer...
Страница 402: ...Chapter 11 Serial Communication Unit...
Страница 456: ...Chapter 12 I2 C Bus Unit...
Страница 491: ...Chapter 13 I2 C Master...
Страница 512: ...Chapter 14 DMA Controller...
Страница 531: ...Chapter 15 Buzzer...
Страница 550: ...Chapter 16 Simplified RTC...
Страница 559: ...Chapter 17 GPIO...
Страница 594: ...Chapter 18 External Interrupt Function...
Страница 612: ...Chapter 19 CRC Generator...
Страница 632: ...Chapter 20 Analog Comparator...
Страница 644: ...Chapter 21 D A Converter...
Страница 655: ...Chapter 22 Voltage Level Supervisor...
Страница 676: ...Chapter 23 Successive Approximation Type A D Converter...
Страница 709: ...Chapter 24 Regulator...
Страница 714: ...Chapter 25 Flash Memory...
Страница 743: ...Chapter 26 Code Option...
Страница 750: ...Chapter 27 LCD Driver...
Страница 788: ...Chapter 28 On Chip Debug Function...
Страница 795: ...Chapter 29 Safety Function...
Страница 813: ...Appendix A...
Страница 881: ...Revision History...