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6.6.2. Milling for depth
Milling stands for the local removal of surface material by means of the focused ion beam. Milling
for depth is a milling mode, which allows removing a given depth.
At a glance
The complete sequence includes:
•
Selecting milling conditions
•
Starting the milling procedure
Preconditions:
•
Electron beam has been switched on
•
Ion beam has been switched on
•
Tilt eucentricity has been adjusted
•
Specimen has been moved to the coincidence point
6.6.2.1. Selecting milling conditions
1
Select
FIB
mode from the drop-down list.
2
Select a milling object from the drop-down
menu, e.g.
Fine Rectangle
.
Summary of Contents for AURIGA Compact Crossbeam
Page 1: ...AURIGA Compact Crossbeam workstation Instruction Manual ...
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