6-5
IM DL850-03EN
Specifications
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App
Index
Analysis
Item
Specifications
Zooming and searching
You can search for and then expand and display a portion of the displayed waveform.
You can choose from the following search methods.
Edge:
The DL850/DL850V counts the number of rising or falling edges
Logic pattern:
The DL850/DL850V counts the number of times a logic pattern
is detected.
Event:
The DL850/DL850V searches for an event number.
Time:
The DL850/DL850V searches for a date and time.
History search feature
You can search through history waveforms for specified conditions.
Zone search:
The DL850/DL850V displays waveforms that pass through or do
not pass through a specified area on the screen.
Parameter search:
The DL850/DL850V displays a waveform when the results of the
automated measurement of its parameters meet the specified
conditions.
Cursor measurement
Horizontal, Vertical, H&V, Degree (only during T-Y waveform display) and Marker
Automated measurement
of waveform parameters
Automated measurement of waveform parameters
Up to 32 items can be displayed.
P-P, Amp, Max, Min, High, Low, Avg, Mid, Rms, SDev, +OverShoot, −OverShoot, Rise, Fall, Freq,
Period, +Width, −Width, Duty, Pulse, Burst1, Burst2, AvgFreq, AvgPeriod, Int1TY, Int2TY, Int1XY,
Int2XY, Delay(between channels)
Statistical processing
Applicable items:
Automated measurement values of waveform parameters
Statistical items:
Max, Min, Avg, Sdv, and Cnt
Maximum number of cycles:
64000 cycles (when the number of parameters is 1)
Maximum total number of
parameters:
64000
Maximum measurement range:
100 Mpoint
Normal statistical
processing
Statistical processing is performed while waveforms are acquired.
Cyclic statistical
processing
The DL850/DL850V automatically measures the waveform parameters of the data in the acquisition
memory and performs statistical processing on the parameters once per period.
Statistical processing of
the history data
The DL850/DL850V automatically measures the waveform parameters of each history waveform
and performs statistical processing on the parameters.
Computation
Operators:
+, −, ×, ÷, binary computation, phase shift, and power spectrum
User-defined computation
(/G2 option)
Expressions can be created through the combination of the following operators and constants.
ABS, SQRT, LOG, EXP, NEG, SIN, COS, TAN, ATAN, PH, DIF, DDIF, INTG, IINTG, BIN, P2, P3,
F1, F2, FV, PWHH, PWHL, PWLH, PWLL, PWXX, DUTYH, DUTYL, FILT1, FILT2, HLBT, MEAN,
LS-, RS-, PS-, PSD-, CS-, TF-, CH-, MAG, LOGMAG, PHASE, REAL, IMAG
Phase shifting
You can monitor the waveform of a specified channel with its phase shifted
GO/NO-GO determination
The following two types of GO/NO-GO determination are available:
• Determination using zones on the screen
• Determination using the automated measurement values of waveform parameters.
The following operations can be performed at the time of determination:
Output of screen capture data, saving of waveform data (to binary, ASCII, or floating-point),
sounding of a notification buzzer, transfer of e-mail
Screen Capture Data Output
Item
Specifications
Built-in printer
(/B5 option)
A hard copy of the screen can be output.
External printer
Prints screen captures on an external printer connected over an Ethernet.
File format
PNG, JPEG, or BMP
Data Storage
Item
Specifications
History
Automatically holds up to 5000 pages of waveforms (depending on the record length)
Internal HDD and external
storage media
Waveform data, setup data, automated measurement values, and the results of statistical
processing can be saved.
6.5 Features