XAUI v12.3 Product Guide
58
PG053 April 6, 2016
Chapter 2:
Product Specification
MDIO Registers 5.14 and 5.15: DTE XS Package Identifier
shows the MDIO Registers 5.14 and 5.15: DTE XS Package Identifier.
shows the DTE XS Package Identifier registers bit definitions.
Test Patterns
The XAUI core is capable of sending test patterns for system debug. These patterns are
defined in Annex 48A of
IEEE Std. 802.3-2012
and transmission of these patterns is
controlled by the MDIO Test Control Registers.
There are three types of pattern available:
• High frequency test pattern of “1010101010....” at each device-specific transceiver
output
• Low frequency test pattern of “111110000011111000001111100000....” at each
device-specific transceiver output
• mixed frequency test pattern of “111110101100000101001111101011000001010...” at
each device-specific transceiver output.
X-Ref Target - Figure 2-26
Figure 2
‐
26:
DTE XS Package Identifier Registers
P
ACKAGE
IDENTIFIER
15
0
Reg 5.15
P
ACKAGE
IDENTIFIER
15
0
Reg 5.14
X13716
Table 2
‐
41:
DTE XS Package Identifier Register Bit Definitions
Bit
Name
Description
Attributes
Default Value
5.14.15:0
DTE XS Package Identifier The block always returns 0 for these bits. R/O
All 0s
5.15.15:0
DTE XS Package Identifier The block always returns 0 for these bits. R/O
All 0s