VeEX VePAL TX300M, User Manual

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Current TIE:
Current time interval error. Defined as “The difference between the measure of a time interval as provided by a clock and the measure of the
same interval as provided by a reference clock” (per ITU-T G.810) in nanoseconds in a one-second interval.
Max + TIE:
Maximum TIE peak during the measurement period.
Max - TIE:
Lowest TIE peak during the measurement period.
MTIE:
Maximum time interval error, maximum TIE difference during a specified measurement.
Wander Measurement Setup
Save TIE to USB Option
The test set may be equipped with the option to save real-time TIE measurements at regular intervals (1, 5, 10, 30 samples per second) for further MTIE/TDEV
post analysis.
If
Save TIE to USB Option
is turned on, select a
sampling rate
from the drop-down menu and insert a FAT32 USB memory stick into the USB port. Pressing
Start
brings up a screen to name the test results.
Press
Apply
to confirm the name and start the test. Once finished, results will automatically be saved to the USB memory stick and can be viewed and analyzed
using the VeEX Wander Analysis PC software..
Naming MTIE/TDEV Results
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13.4.3 Wander Analysis PC Software
VeEX Wander Analysis PC Software is available for viewing and analyzing TIE data results. It offers the following capabilities:
Fast processing of TIE data into MTIE and TDEV analysis
Includes all major recommended Masks, applicable to field testing, as well as easy-to-program user-defined masks
PDF report generation
Windows 7, Vista, XP compatible
Wander Analysis Installation Steps
TX300S_e-manual_D07-00-064P_RevA00