M-2000® Hardware Manual
©2023 J.A. Woollam Co.
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Figure 5-19. Mueller Matrix data.
To view specific Mueller Matrix elements, choose ‘Select Mueller Matrix
Elements’, and a new window will appear allowing the user to specify which
elements to display.
Figure 5-20. Mueller Matrix Element Selection window.
Reflection Intensity
This Data Type measures the reflected intensity of the light beam. Baseline
intensity is measured from a reference sample (thermal oxide on silicon).
Note:
Reflection Intensity is also measured with “Standard” Data Type,
but no baseline is used. Reflection Intensity Data Type is
recommended for best accuracy.
Figure 5-21. Reflection Intensity data acquisition.
Summary of Contents for M-2000
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