User Manual
913
Rev. 1.1
2019-03-18
TLE984xQX
Microcontroller with LIN and Power Switches for Automotive Applications
10-Bit Analog Digital Converter (ADC1)
Figure 208 Structure of Differential Measurement Unit
The data processing unit also offers a differential evaluation of the Monitoring Channels. This offers the
possibility to build up a V
DS
Monitoring for H-Bridge control. The V
DS
Monitoring is realized by the Sequencer.
The user enables the 4 required MONs in the sequencer and the sequencer triggers the ADC to perform the
measurements. In a failure case, CTRAP_3 is configurable to switch CCU6-Channels to passive state without
CPU Load or Interrupt Handling of Differential Unit (TLE9845QX only!)Due to the fact that this measurements
need to be aligned to a certain PWM control scenario there is necessary to blank the measurments which are
falling in the switching phase of a PWM channel. For this purpose there is a special enable procedure for the
DU unit whose timing is sketched in
.
SCU_PM-IRQ
Digital Signal Processing
Differential Unit
VREF
Calibration Unit:
y= a + (1+b)*x
+
-
TH_UP_CHx
TH_LOW_CHx
/
Channel Controller
(Sequencer)
MUX_SEL<4:0>
A D
∑
DIFF1_UP_X_STS
DIFF 1_LOW_X_STS
5
/
12
+ / -
+ / -
/
12
/
1
/
1
10 Bit ADC
ADC - SFR
ADC_OUT_CHx
/ 12
ADC_OUT_CHx
/
12
MUX
CH10
CH9
CH8
CH7
CH6
CH2
CH1
CH0
CH11
CH3
CH4
CH5
CH14
CH13
CH12
CH15
n.u.
n.u.
MON1
MON2
MON3
MON4
n.u.
n.u.
n.u.
n.u.
n.u.
n.u.
n.u.
n.u.
n.u.
n.u.
ADC1_CTRL_STS
ADC1_CTRL_STS
ADC1_FILTOUT...
+
-