MI 3101 EurotestAT: Appendix F
Country notes
118
F Appendix F – Country notes
This appendix F contains collection of minor modifications related to particular country
requirements. Some of the modifications mean modified listed function characteristics
related to main chapters and others are additional functions. Some minor modifications are
related also to different requirements of the same market that are covered by various
suppliers.
F.1 List of country modifications
The following table contains current list of applied modifications.
Country Related chapters Modification type Note
AT
5.3, 8.3, F.2.1
Appended
Special G type RCD
ES F.2.2
Appended
CONTINUITY
LOOP
RE
IT F.2.3
Appended CONTINUITY
LOOP
RE
CH F.2.4
Appended
Change
L/N
ES1 Appendix
G Appended
Application of regulative UNE-202008
DK
5.4, Appendix H
Appended
Fault loop test modified
F.2 Modification issues
F.2.1
AT modification - G type RCD
Modified is the following related to the mentioned in the chapter
5.3
:
-
G type mentioned in the chapter is converted to unmarked type
,
-
Added G type RCD,
-
Time limits are the same as for general type RCD,
-
Contact voltage is calculated the same as for general type RCD.
Modifications of the chapter 5.3
Test parameters for RCD test and measurement
TEST RCD
sub-function
test [Tripout time t, Uc, AUTO, Tripout current].
Idn
Rated
RCD residual current sensitivity I
N
[10 mA, 30 mA, 100 mA, 300 mA,
500 mA, 1000 mA].
type
RCD
type
[ , , ]
,
test current
waveform
plus
starting
polarity
[
,
,
,
,
,
]
.
MUL
Actual
test current relative to rated Idn [½, 1, 2, 5].
Ulim Conventional
touch
voltage
limit
[25 V, 50 V].
The instrument is intended for testing of general
,
G
(non-delayed) and selective
S
(time-delayed) RCDs, which are suited for:
Alternating residual current (AC type, marked with
symbol),
Pulsating residual current (A type, marked with symbol).
DC residual current (B type, marked with symbol).
Time delayed RCDs demonstrate delayed response characteristics. They contain residual
current integrating mechanism for generation of delayed trip out. However, contact voltage
