MI 3101 EurotestAT: Measurements
Testing RCD
52
5.3 Testing RCDs
Various test and measurements are required for verification of RCD(s) in RCD protected
installations. Measurements are based on the EN 61557-6 standard.
The following measurements and tests (sub-functions) can be performed:
Contact voltage,
Trip-out time,
Trip-out current,
RCD autotest.
See chapter
4.2 Single test
for functionality of keys.
Figure 5.12: RCD test
Test parameters for RCD test and measurement
TEST RCD
sub-function
test [Tripout time t, Uc, AUTO, Tripout current].
Idn
Rated
RCD residual current sensitivity I
N
[10 mA, 30 mA, 100 mA, 300 mA,
500 mA, 1000 mA].
type
RCD
type
[ , ]
,
test current
waveform
plus
starting
polarity
[
,
,
,
,
,
]
.
MUL
Actual
test current relative to rated Idn [½, 1, 2, 5].
Ulim Conventional
touch
voltage
limit
[25 V, 50 V].
The instrument is intended for testing of
G
eneral (non-delayed) and
S
elective (time-
delayed) RCDs, which are suited for:
Alternating residual current (AC type, marked with
symbol),
Pulsating residual current (A type, marked with symbol).
DC residual current (B type, marked with symbol)
Time delayed RCDs demonstrate delayed response characteristics. They contain residual
current integrating mechanism for generation of delayed trip out. However, contact voltage
pre-test in the measuring procedure also influences the RCD and it takes a period to
recover into idle state. Time delay of 30 s is inserted before performing trip-out test to
recover RCD after pretests.
