Time-of-Flight Single Mass Spectrometry
In a time-of-flight single mass spectrometry (TOF MS) scan, the system generates mass spectrometric information
by pulsing ions into a flight tube and recording their precise arrival time at the detector. Ions with a greater
mass-to-charge ratio take longer to travel the flight tube.
Tandem Mass Spectrometry
The technique of MS/MS is well-suited to mixture analysis because the characteristic product ion spectra can be
obtained for each component in a mixture without interference from the other components, assuming that the
product ions have a unique m/z ratio.
Use MS/MS for targeted analysis by monitoring specific precursor/product ions while the sample is eluting. This
type of analysis is more specific than single MS, which only discriminates on the basis of the mass-to-charge ratio.
Product Ion Mass Spectrometry
In a product ion scan (
Product Ion
), the system generates mass spectrometric information by selecting a particular
precursor ion window in Q1, fragmenting in Q2 (a collision cell) and pulsing the ions (fragment ions) into a flight
tube and recording their precise arrival time at the detector. Product ions can provide information on the molecular
structure of the original (precursor) ions.
Precursor Ion Mass Spectrometry
In a precursor ion scan, the system detects precursor ions that generate a specific product ion. The instrument
uses Q1 in mass resolving mode to scan over the mass range of interest, while the TOF section records product
ion spectra for each precursor ion. The Q1 mass spectrum shows all precursor ions that produce the product ion
of interest.
About Spectral Data Acquisition
Spectral data can be acquired in one of the modes described in
Spectral Data can only be acquired from Q1 and Precursor Ion scan types.
System User Guide
TripleTOF
®
5600/5600+ System
RUO-IDV-05-7040-B
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Operating Instructions — Acquisition Methods
