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JD780A Series Analyzers
Using TD-SCDMA Signal Analyzer
423
can continue your measurement.
Procedure
1.
Press the
MEASURE SETUP
hot key.
2.
Press the
Slot Number
soft key, and then select the time slot number to be displayed:
TS0
,
TS1
,
TS2
,
TS3
,
TS4
,
TS5
, or
TS6
.
3.
Optional
. To set the delay, complete the following steps:
a.
Press the
Delay
soft key to set the amount of delay in µs.
b.
Enter a value by using the numeric keys. You can also use the rotary knob.
c.
Press the
µs
soft key.
NOTE
The Delay setting is used only when there is a time offset in the signals to be measured.
Measurement example
Figure 207
Occupied bandwidth measurement with TD-SCDMA signal analyzer
NOTE
You can use the
LIMIT
hot key to analyze your measurements with the user-definable
limit and Pass/Fail indication. See
“Setting limit for RF tests” on page 428 for more
information.
Spectrum emission mask (SEM)
The Spectrum Emission Mask (SEM) measurement required by 3GPP specifications encompasses
different power limits and different measurement bandwidths (resolution bandwidths) at various
frequency offsets. It may be expressed as a ratio of power spectral densities between the carrier and
the specified offset frequency band. It provides useful figures-of-merit for the spectral re-growth and
emissions produced by components and circuit blocks, without the rigor of performing a full SEM
measurement.
The SEM measures spurious signal levels in up to five pairs of offset or region frequencies and relates
Содержание CellAdvisor JD780A Series
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Страница 254: ...JD780A Series Analyzers 254 Using LTE FDD Signal Analyzer 3 RS SINR 4 S SS RSSI 5 P SS Power...
Страница 323: ...JD780A Series Analyzers Using LTE TDD Signal Analyzer 323 3 RS SINR 4 S SS RSSI 5 P SS Power...
Страница 390: ...JD780A Series Analyzers 390 Using EV DO Signal Analyzer 3 Pilot 4 MAC 64 5 MAC 128...
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Страница 590: ...JD780A Series Analyzers 590 Appendix Figure 306 Append keywords window...