88
000000Ć1150Ć839 IOLMaster 11.02.2004
Optical radiation
Surrounding field illumination/
WTW determination
Wavelength
Delivered power
880 nm
< 100
W
Axial length measurement
Light source
Wavelength
Max. power for measuremen
Max. power for alignment
Measuring time for individual
measurement, Pulse width
Number of possible individual
measurements
Laser class
In intended use
Embedded Laser Class (not accessible)
Semiconductor diode laser (MMLD)
780 nm
450
W
80
W
0.5 s
20 per eye and day
1 (EN 60825Ć1)
3B
Fixation light for keratometer and anterior
chamber depth measurement and
WTW determination
Wavelength
Delivered power
590 nm
< 1
W
Illumination for keratometer measurement
Wavelength
Delivered power
880 nm
< 50
W
Slit illumination for anterior chamber depth
measurement, integral irradiance
UV (300 ... 400 nm)
IR (700 ... 1100 nm)
L
B
(phakic eye)
L
A
(aphakic eye)
0.00087 mW cm
-2
0.04 mW cm
-2
(in spectral region from 860 to 1,100 nm no emission of light source
detectable)
122.8 W (m
2
sr)
-1
125.5 W (m
2
sr)
-1
Technical Data
