Sun Microelectronics
369
C
Index
board-level interconnect testing and
diagnosis 329
boiundary scan register 336
boundary scan 329
boundary scan chain 334
boundary scan register 334 to 335
branch
mispredicted 14
predicted not taken 287
predicted taken 287
branch history 6
branch prediction 13, 267
likely not taken state 268
likely taken state 268
branch prediction logic 5
branch target alignment 262
branch transformation to reduce mispredicted
branches
illustrated 271
BST, see Number of Block Stores (BST) subfield of
UPA_CONFIG register
bus error 39, 182
during exit from RED_state 170
Bus Error (BERR) field of AFSR 181
bus errors 38
bus timeout error 182
bus turn-around 278
bus turn-around penalty
avoiding 278
bus turn-around time 278
BUSY bit 117
BUSY field of ASI_INTR_DISPATCH_STATUS
register 161, 164
BUSY, see BUSY field of ASI_INTR_DISPATCH_
STATUS register
bypass ASI 54, 146, 305
byte granularity 279
Byte Mask 110, 142
BYTE_WE_L signals 341
Bytemask field 142
BYTEWE_L pins 340
C
C Stage 276, 290, 292
C stage 269
cache
direct mapped 274
external 18
flushing 28
inclusion 28
level-1 27
level-2 27
set-associative 274
write-back 27
Cache Access (C) Stage 14
illustrated 11
cache coherence
state transitions 95
without Dtags 101
cache coherence (sequence with Dtags) 99
cache coherence model 98
using duplicate tags (Dtags) illustrated 99
cache coherence protocol 30, 74, 94
state diagram illustrated 95
transitions allowed 97
write-invalidate 98
cache coherency 8
cache coherent transactions 102
cache flush
software 29
cache line 6
dirty 362
invalidating 29
cache miss 290
impact 4
cache timing 292
cacheable accesses 18, 30, 291, 294
cacheable after non-cacheable accesses 258
cacheable domain 34
Cacheable in Physically Indexed Cache (CP) field
of TTE 43, 257
Cacheable in Physically Indexed Cache (PC) field
of TTE 248
Cacheable in Virtually Indexed Cache (CV) field
of TTE 43
cacheable store 295
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