Lucent Technologies SLC-2000 Access System Central Office Terminal, Assembly Manual

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363-208-010
Applications
Issue 5 May 1997
A-23
DC Test Access Application
Drop or loop testing is provided via the
SLC-2000 Integral Test Head (ITH), or a
Remote Measuring Unit (RMU), Tollgrade DC by-pass pair or a metallic D.C. by-
pass test pair. The SLC Access System is compatible with the Pair Gain Test
Controller (PGTC) or Extended Test Controller (XTC), operating in the PGTC
mode, for demand loop testing of universal systems.
Metallic DC Test Pair
Refer to Figure A-9A for a typical overall testing arrangement utilizing the metallic
D.C. Test Pair.
Only one test pair is needed to any remote site for a maximum of 1,000 lines by
multiplying the TTR and TTT leads at the distributing frame. Any number of
SLC-
2000 COT systems assigned to the same RT location can share the same DC
Test pairs (TTT, TTR). The inhibit leads (INH) of the shared system must also be
strapped together provided the 1,000 line maximum restriction is observed or as
traffic dictates.
Figure A-9B represents a typical Test Access (DC Test) Pair cabling arrangement
with one
SLC-2000 COT serving two remote sites each with four SLC-2000 RT
bays. Note that all inhibit leads from the one COT frame that are associated with
the same DC Test pair are multipled (strapped) together at the MDF. A separate
metallic test pair is run to each remote site.
NOTE
:
Cross connections to the DC Test Pair must utilize protectors at the MDF
and FDI.
The metallic pair tip and ring leads are multipled to their respective DC Test Pair
tip and ring leads at the MDF and FDI.