196
Function specifications
Contact check
4-terminal contact check
Function
Performs a contact (disconnection) check between H
CUR
and H
POT
and be-
tween L
CUR
and L
POT
.
Check timing
Variable
•
BEFORE: Checks contact before measurement.
•
AFTER : Checks contact after measurement.
•
BOTH : Checks contact before and after measurement.
Threshold setting
Variable
Settings: 1 to 5, with larger values indicating greater sensitivity (low contact
resistance values)
Default setting: 4 (50
Ω
)
Setting value
1
2
3
4
5
Threshold values of the
contact resistance (
Ω
)
1000
500
100
50
20
Delay time setting
A user-specified delay time may be set since the contact check may not
function properly if the sample is a charged capacitor.
Settable time: 0.0000 s to 1.0000 s (0.0001 s resolution)
Default setting: 0.0000 s
Default setting
OFF
High-Z reject function (detection of OPEN state during 2-terminal measurement)
Function
When the measurement value is higher than the judgment reference, a con
-
tact error is output.
Judgment reference
Can be set to 0% to 30000% (1% resolution) of range full-scale.
Error output
•Displays errors on the measurement screen.
•
Outputs errors to an external device from the EXT I/O connector.
Default setting
OFF
Memory
Function
•Measurement result items (maximum 32000 items) can be saved to the
instrument.
•
Memory can be read using communications commands or a USB flash
drive.
Number of measurement
results setting range
•1 to 32000
Operation mode
OFF/ IN/ ON
•
OFF: Memory function disabled
•
IN : Saves measured values in memory only when all measurement
parameters that are being judged using the comparator or BIN func
-
tion yield a “PASS” result.
•
ON : Saves all measured values.
Default setting
OFF
Number of display digits setting
Function
Allows you to set the number of display digits for measured values for each
measurement parameter.
Valid setting range
3 to 6 digits
Default setting
6 digits
Summary of Contents for IM3536
Page 20: ...16 Operating Precautions ...
Page 34: ...30 Screen Layout and Operation ...
Page 140: ...136 Testing the System Self diagnosis ...
Page 224: ...220 About Measurement Times and Measurement Speed ...
Page 240: ...236 Discarding the Instrument ...