Biotek EL800, Operator'S Manual

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Chapter 6: Troubleshooting and Error Codes
BioTek Instruments, Inc.
Overview
If an error code appears on the display (or in Gen5™, KC4™, or KCjunior™), consult
the error code list to see if the error is easily correctable. If you cannot resolve the
problem, run the instrument
System Test and note the exact error code and serial
number of the reader. Then call BioTek’s Technical Assistance Center (refer to
Chapter 1 for contact information).
System Test Description
The System Test feature conducts a series of tests, at each of five set wavelengths,
which confirm adequate light levels, low electronic noise, adequate photodiode
sensitivity, and overall system cleanliness. The testing is designed to ensure that the
ELx800™ will give in-specification performance for each set wavelength over the
specified OD range.
The reader automatically runs an internal System Test each time it is powered on. The
reader will “chirp” repeatedly if the power-on System Test results do not meet the
internally coded Failure Mode Effects Analysis (FMEA) criteria established by BioTek.
A system test should then be initiated to try to retrieve an error code from the reader.
Glossary of Terms
•
Air Blank: A full light reading through a filter with no plate in the light
path.
•
Dark Current:
A reading taken with the light blocked to measure
background light levels in the reading chamber. Also used as a measure of
background electronic noise within the measurement circuit.
•
Gain: An automatic electronic adjustment to the measurement circuit. The
gain adjustment compensates for changing light levels or filter variations.
For example, if the lamp output decreases slightly, the gain will increase to
make up the difference.
•
Axis:
Refers to a motor for the filter wheel or plate carrier.
•
Offset: A numerical limit, usually a range. For example, if the gain fails an
offset test, it may be too high or too low.