3.5 Setting Screen Reference
3
-
76
ZA 57630
device or other external storage device if necessary.
○ Setting procedure
<Execution operations (requiring confirmation)>
○ Functions of function keys
・
[DELETE]
: Delete the measurement data.
■ [DELETE REF]
: Delete the reference data.
This deletes the reference data (REF DATA) from memory. The graph traces are also deleted.
The data cannot be recovered after deletion, so save the data to a USB memory device or
other external storage device if necessary.
○ Setting procedure
<Execution operations (requiring confirmation)>, <Numerical settings (requiring
confirmation)>, <Numerical settings>
The setting range is 1 (= REF1) to 8 (= REF8) and the setting resolution is 1.
○ Functions of function keys
・
[DELETE]
: Delete the specified reference data.
・
[EDIT]
: Set the reference data to delete with the numerical input palette.
・
[MODIFY]
: Modify the reference data to delete with the knob or cursor keys.
■ [CONDITION VIEW]
: Display the settings at the time of data measurement.
This displays the conditions (excerpt) set at the time the current active data (MEAS DATA or
REF DATA) was measured. Please note that the displayed setting conditions are not the
current settings of this instrument.
○ Setting procedure
<Execution operations (immediate execution)>
For sequence measurement data, the measurement conditions for each measurement
memory number are displayed. The memory number for which to display measurement
conditions can be changed with the function keys.
○ Functions of function keys
・
[PREV]
: Display the measurement conditions for the previous memory number.
(This is enabled for sequence measurement data.)
・
[NEXT]
: Display the measurement conditions for the next memory number.
(This is enabled for sequence measurement data.)
(Supplementary explanation)
・
FREQUENCY / AMPLITUDE / DC BIAS displayed in CONDITION VIEW indicate the
values set at the time of measurement even if signal output (OSC) was off at the time
of measurement.
・
FREQUENCY of the frequency sweep data is not the frequency at the time of
measurement. Likewise, AMPLITUDE in the measurement signal amplitude sweep
data and DC BIAS in the DC bias sweep data are not the conditions at the time of
Содержание ZA57630
Страница 1: ...NF Corporation IMPEDANCE ANALYZER ZA57630 INSTRUCTION MANUAL BASICS...
Страница 2: ......
Страница 3: ...IMPEDANCE ANALYZER ZA57630 INSTRUCTION MANUAL BASICS DA00068820 003...
Страница 22: ...1 8 ZA57630 Blank...
Страница 28: ...2 2 Assembly and Installation 2 6 ZA 57630 Figure 2 1 Rack Mount Kit Assembly Drawing JIS...
Страница 29: ...2 2 Assembly and Installation 2 7 ZA 57630 Figure 2 2 Rack Mount Kit Assembly Drawing EIA...
Страница 30: ...2 2 Assembly and Installation 2 8 ZA 57630 Figure 2 3 Rack Mount Dimensions JIS...
Страница 31: ...2 2 Assembly and Installation 2 9 ZA 57630 Figure 2 4 Rack Mount Dimensions EIA...
Страница 36: ...2 14 ZA 57630 Blank...
Страница 224: ...5 14 Miscellaneous Specifications 5 40 ZA57630 Figure 5 1 External dimensions...
Страница 240: ...XVI ZA57630 Blank...
Страница 242: ......
Страница 244: ......
Страница 245: ......
Страница 246: ...http www nfcorp co jp NF Corporation 6 3 20 TsunashimaHigashi Kohoku ku Yokohama223 8508JAPAN...