17-38
SCPI Command Reference
FAIL:SMLocation <NRf> | NEXT
PASS:SMLocation <NRf> | NEXT
:CALCulate2:CLIMits:FAIL:SMLocation <NRf> | Next
Specify
“
fail
”
source memory location
:CALCulate2:CLIMits:PASS:SMLocation <NRf> | Next
Specify
“
pass
”
source memory location
Parameters
<NRf> = 1 to 100
Specify memory location point
NEXT
Next memory location point in list
(present lo 1)
Query
:SMLocation?
Query
“
pass
”
or
“
fail
”
source memory location
Description
While using a Source Memory Sweep when performing limit tests, the
sweep can branch to a speci
fi
ed memory location point or proceed to the
next memory location in the list.
When a memory location is speci
fi
ed with PASS, the sweep will branch to
that memory location if the test is successful (PASS condition). If not suc-
cessful (FAIL condition), the sweep proceeds to the next memory location
in the list. With NEXT selected (the default), the sweep proceeds to the next
memory location (present lo 1) in the list regardless of the outcome
of the test (PASS or FAIL condition).
When a memory location is speci
fi
ed with FAIL, the sweep will branch to
that location on a failure. If not (PASS condition), the sweep proceeds to the
next memory location in the list. With NEXT selected (the default), the
sweep proceeds to the next memory location (present lo 1) in the list
regardless of the outcome of the test (FAIL or PASS condition). Note that
branch on FAIL is available only via remote.
See Section 9,
Source memory sweep
for more information.
:BCONtrol <name>
:CALCulate2:CLIMits:BCONtrol <name>
Control Digital I/O port pass/fail update
Parameters
<name> =
IMMediate
Update output when
fi
rst failure occurs
END
Update output after sweep is completed
Query
:BCONtrol?
Query when digital output will update
Description
This command is used to control when the digital output will update to the
“
pass
”
or
“
fail
”
bit pattern. The
“
pass
”
or
“
fail
”
bit pattern tells the handler
to stop the testing process and place the DUT in the appropriate bin.
With IMMediate selected, the digital output will update immediately to the
bit pattern for the
fi
rst failure in the testing process. If all the tests pass, the
output will update to the
“
pass
”
bit pattern.
With END selected, the digital output will not update to the
“
pass
”
or
“
fail
”
bit pattern until the SourceMeter completes the sweep or list operation. This
allows multiple test cycles to be performed on DUT. With the use of a scan-
ner card, multi-element devices (i.e. resistor network) can be tested. If, for
example, you didn't use END and the
fi
rst element in the device package
passed, the
“
pass
”
bit pattern will be output. The testing process will stop
and the DUT will be binned. As a consequence, the other elements in the
device package are not tested.
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Страница 78: ...2 14 Connections ...
Страница 98: ...3 20 Basic Source Measure Operation ...
Страница 138: ...5 30 Source Measure Concepts ...
Страница 156: ...6 18 Range Digits Speed and Filters ...
Страница 168: ...7 12 Relative and Math ...
Страница 176: ...8 8 Data Store ...
Страница 202: ...9 26 Sweep Operation ...
Страница 248: ...11 22 Limit Testing ...
Страница 310: ...16 6 SCPI Signal Oriented Measurement Commands ...
Страница 418: ...17 108 SCPI Command Reference ...
Страница 450: ...18 32 Performance Verification ...
Страница 477: ...A Specifications ...
Страница 489: ...B StatusandErrorMessages ...
Страница 498: ...B 10 Status and Error Messages ...
Страница 499: ...C DataFlow ...
Страница 503: ...D IEEE 488BusOverview ...
Страница 518: ...D 16 IEEE 488 Bus Overview ...
Страница 519: ...E IEEE 488andSCPI ConformanceInformation ...
Страница 523: ...F MeasurementConsiderations ...
Страница 539: ...G GPIB488 1Protocol ...
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