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Debug Support
e200z3 Power Architecture Core Reference Manual, Rev. 2
9-6
Freescale Semiconductor
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Instruction complete debug events
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Interrupt taken debug events
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Return debug events
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Unconditional debug events
These events are described in further detail in the EREF.
The core defines the following debug events, which are described in
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The debug counter debug events DCNT1 and DCNT2
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The external debug events DEVT1 and DEVT2
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The critical interrupt taken debug event (CIRPT)
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The critical return debug event (CRET)
The core debug framework supports most of these event types. The following Book E–defined
functionality is not supported:
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Instruction address compare and data address compare real address mode
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Data value compare mode
A brief description of each of the debug event types is shown in
. In these descriptions, DSRR0
and DSRR1 are used to store the address of the instruction following a load or store, assuming that the
debug APU is enabled. If it is disabled, CSRR0 is used.
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