Interrupts and Exceptions
e200z3 Power Architecture Core Reference Manual, Rev. 2
4-4
Freescale Semiconductor
4.3
Exception Syndrome Register (ESR)
ESR, shown in
, provides a syndrome to distinguish exceptions that can generate the same
interrupt type. The e200z3 adds some implementation-specific bits to this register.
Figure 4-1. Exception Syndrome Register (ESR)
The ESR fields are described in
Instruction TLB error
14
Instruction translation lookup did not match a valid TLB entry.
Debug
15
Trap, instruction address compare, data address compare, instruction complete,
branch taken, return from interrupt, interrupt taken, debug counter, external
debug event, unconditional debug event
Reserved
6–31
—
—
SPE unavailable
32
Section 4.6.18, “SPE APU Unavailable Interrupt (IVOR32).”
SPE data
33
See
Section 4.6.19, “SPE Floating-Point Data Interrupt (IVOR33).”
SPE round
34
See
Section 4.6.20, “SPE Floating-Point Round Interrupt (IVOR34).”
1
Vector to [p_rstbase[0:19]] || 0xFFC in e200z3. Vector to [p_rstbase[0:29]] || 2’b00 in e200z335.
2
Autovectored external and critical input interrupts use this IVOR. Vectored interrupts supply an interrupt vector offset directly.
32
35
36
37
38
39
40 41
42
43
44
45
46
47
48
55
56
57
58
59
61
62
63
Field
—
PIL PPR PTR FP ST — DLK
ILK
AP PUO BO PIE
—
SPE — VLEMI
—
MIF XTE
Reset
All zeros
R/W
R/W
SPR
SPR 62
Table 4-3. ESR Field Descriptions
Bit(s)
Name
Description
Associated Interrupt Type
32–35
—
Reserved, should be cleared.
—
36
PIL
Illegal instruction exception
Program
37
PPR
Privileged instruction exception
Program
38
PTR
Trap exception
Program
39
FP
Floating-point operation
Alignment, data storage, data TLB, program
40
ST
Store operation
Alignment, data storage, data TLB
41
—
Reserved, should be cleared.
—
42
DLK
Data cache locking
1
Data storage
43
ILK
Instruction cache locking
Data storage`
Table 4-2. Exceptions and Conditions (continued)
Interrupt Type
IVOR
n
Cause
Section/Page
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