Chapter 9
Using LTE-TDD Signal Analyzer
JD700B Series User’s Guide
297
Measurement example
Figure 170 Spurious emissions measurement with LTE-TDD signal analyzer
NOTE
You can use the
LIMIT
hot key to analyze your measurements with the user-definable
limit and Pass/Fail indication. See “Setting limit for RF tests” on page 297 for more
information.
Setting limit for RF tests
By default, test limits specified in the standard are set for you. You can change thresholds if you desire.
Procedure
1
Press the
LIMIT
hot key.
2
Press the
RF Test Limits
soft key.
3
Select the test item(s) and set the limit(s) depending on your selected measurement mode:
To set the limit for
Select
Set
Channel power
Channel Power
High Limit, Low Limit
Occupied bandwidth
Occupied BW
High Limit
Spectrum emission mask
Spectrum Emission Mask
(On/Off only)
ACLR
ACLR
(On/Off only)
Multi-ACLR
Multi-ACLR
(On/Off only)
Spurious emissions
Spurious Emissions
(On/Off only)
4
Optional
. You can enable alarm sound that goes off if the measurement falls outside of the limit.
Toggle the
Beep
soft key between
On
and
Off
to enable or disable the beep sound.
5
Optional
. Go to
SAVE/LOAD > Save
, and then select
Limit
to save the limit settings.
See “Using save” on page 35 for more information.