Chapter 9
Using LTE-TDD Signal Analyzer
292
JD700B Series User’s Guide
Measurement example
Figure 166 Occupied bandwidth measurement with LTE-TDD signal analyzer
NOTE
You can use the
LIMIT
hot key to analyze your measurements with the user-definable
limit and Pass/Fail indication. See “Setting limit for RF tests” on page 297 for more
information.
Spectrum emission mask (SEM)
The Spectrum Emission Mask (SEM) measurement required by 3GPP specifications encompasses different
power limits and different measurement bandwidths (resolution bandwidths) at various frequency offsets. It
may be expressed as a ratio of power spectral densities between the carrier and the specified offset
frequency band. It provides useful figures-of-merit for the spectral re-growth and emissions produced by
components and circuit blocks, without the rigor of performing a full SEM measurement.
The SEM measures spurious signal levels in up to five pairs of offset or region frequencies and relates them
to the carrier power.
Setting measure setup
After configuring test parameters as described in the “Configuring test parameters” on page 283, you can
continue your measurement.
Procedure
1
Press the
MEASURE SETUP
hot key.
2
To set the nominal channel bandwidth to be measured, complete the following steps:
Press the
Bandwidth
soft key.
Select the bandwidth option from the choices:
1.4 MHz
,
3 MHz
,
5 MHz
,
10 MHz
,
15 MHz
,
and
20 MHz
.
3
To select the mask type, complete the following steps:
Press the
Mask Type
soft key.
Select the mask type option, from the following choices:
Wide Area BS Category A
Wide Area BS Category B
