Hioki 3511-50, Instruction Manual, Page: 60 / 140

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5.1 Testing Using EXT I/O
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5.1.7 Time Taken for Testing
NOTE
Testing speed
Test frequency
FAST NORM SLOW
T3
Number
of times
T3
Number
of times
T3
Number
of times
120 Hz 8.3 ms 1 17 ms 4 67 ms 5
1 kHz 1 ms 1 4 ms 7 8 ms 24
Testing speed
Test frequency
FAST NORM SLOW
120 Hz 13 ms 90 ms 400 ms
1 kHz 5 ms 60 ms 300 ms
(Allowance 2 ms)
Testing speed
Test frequency
Z-
θ
C-D L-D/Q R
120 Hz 0 ms 1.5 ms 1.5 ms 1 ms
1 kHz 0 ms 1.5 ms 1.5 ms 1 ms
(Allowance 2 ms)
The time taken for testing varies according to the test conditions. The
following values may be used for reference.
These values are all for reference only. Do not rely upon them absolutely, because
the actual time taken for testing depends upon many operational conditions.
(1) Analog testing signal (INDEX
________
)
The output time (T3) of the analog testing signal (INDEX
________
) taken according
to the testing speed:
Measurements are averaged if the testing speed setting is NORM or SLOW.
The INDEX
________
signal is output for the number of times indicated in the table
below.
(2) Testing finished signal (EOM)
Use the following equation to obtain the output time of the testing finished
signal (EOM):
T4 = (A) + (B) + (C) + (D)
(A) The time taken for testing for Z-
θ
display, normal test mode, open/short
circuit compensation off, and HOLD range:
(B) The time taken for calculation varies according to the display parameters: