Hioki 3511-50, Instruction Manual, Page: 33 / 140

21
________________________________________________________________________________________________________________
3.7 Open Circuit Compensation
________________________________________________________________________________________________________________
NOTE
3.7.1 Performing Open Circuit Compensation
NOTE
NOTE
3.7 Open Circuit Compensation
With open circuit compensation, it is possible to reduce the influence of the
floating impedance of the test cables and thereby to enhance the accuracy of
measurement. It is effective for test samples whose impedance is relatively
high.
With open circuit compensation set, compensated values for 120 Hz and 1
kHz are input. These are unrelated to test frequency setting conditions.
The testing accuracy specified in the specification of the 3511-50 unit
assumes that open circuit compensation and short circuit compensation is
being performed, as appropriate.
When you have changed the test cables, be sure to perform compensation
again. Correct test values will not be obtained if you go on testing using
the same old compensation values which were obtained before the cable
change.
Compensation is possible for the impedance range of 1 k
Ω
or greater.
Procedures
(1) Make sure that the HIGH and LOW leads are not contacted together.
As closely as possible, route the test cable and set the probe-terminal
distance during this procedure as if performing actual measurement.
Execute the guarding process. For the guarding process, refer to Section 5.4,
"Testing High Impedance Elements."
(2) Press . Begin compensation upon confirmation that the first
parameter measurement display (MAIN PARAMETER) is as shown.
The LED lamp flashes during open circuit compensation.
(3) If compensation ends properly, the unit beeps once and returns to normal
test mode.
(4) Refer to the LED lamp to the left of the key to check for normal
completion of open circuit compensation.
Open circuit compensation takes about 30 s.