Hioki 3511-50, Instruction Manual, Page: 59 / 140

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5.1 Testing Using EXT I/O
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5.1.6 I/O Signal Timing
TRIG
_____
(Testing start signal)
INDEX
_______
(Analog measurement in progress signal)
EOM
_____
(Measurement finished signal)
HI
___
, IN
___
, LO
___
(Comparator result output)
T2
T1
T5
T4
Decision result
T3
Previous decision result
Symbol Meaning
Timing
(approximate)
T1
TRIG width (LOW)
Minimum time period that trigger signal is low
100
µ
s
T2
From TRIG (LOW) to INDEX (LOW)
Time period from trigger to circuit response
500
µ
s*
1
T3
INDEX width (LOW)
Minimum chucking time; chucking switching on INDEX
(HIGH) possible
1 ms*
2
T4
EOM width (LOW)
Time period for testing
5 ms*
2
T5
From EOM (HIGH) to TRIG (LOW)
Minimum time period from end of testing to next trigger
0 s
With the test conditions for testing by the comparator having been set (with
the trigger setting set to external trigger), when in this state a trigger signal
is input via the EXT I/O connector, or when the
key is pressed, then
the decision result is output on the comparator result output signal line of
the EXT I/O connector.
An example of testing timing is as follows:
*1: With the panel load function, when a new panel number is loaded, the
response time takes about 1 second.
*2: Reference value with the following conditions; test frequency:
1 kHz, testing speed:FAST, and when measuring |Z|.