GE 5205000, Service Manual

Page: 291 / 808

GE
D
IRECTION
5535208-100, R
EV
. 2 LOGIQ E9 S
ERVICE
M
ANUAL
Chapter 7 Diagnostics/Troubleshooting 7 - 43
7-5-8-1 Digital Receive (cont’d)
Name: Nathan MLA Data Alignment Test
Description: Output TVG of Nathan with system configured for max number of MLAs supported by
system. Each MLA gain is set differently to detect MLA ordering problems. Verifies the alignment (16
identical samples in a row) of IF to GFI.
Run Time: 00:05
If this test failed:
1.) Swap DRX boards to determine if the failure point changes as the boards are moved.
2.) Replace any failed DRX boards.
7-5-8-2 Memory
See: 7-5-3 "Diagnostics Window Overview" on page 7-22 for a description of the looping and list
features.
Symptoms:
• Intermittent Problems
• Communication Problems
1.) Select the Memory checkbox to run all the tests, or select the individual subtests to run only the
selected tests.
2.) Enter the desired Loop Count (numeric value of 4 digits or less).
3.) Click Execute to run the test(s).