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Model T940 User Manual
Publication No. 980938 Rev. K
Advanced Topics 8-32
Astronics Test Systems
o
Clear both Pause Edge test flip-flops just before the beginning of the
Sequence (option #1)
o
Clear both Pause Edge test flip-flops just before the beginning of the
Sequence and just before the beginning of each subsequent
Sequence Step (option #2)
o
Clear both Pause Edge test flip-flops just before the beginning of the
Sequence but only clear the selected Pause Edge Test flip-flops with
a CPU Resume, Mated External Resume or the timeout of Pattern
Delay Timer. (option #3).
•
Phase Edge Test 1-4 Clear operation:
o
Clear all 4 Phase Edge Test flip-flop pairs just before the beginning of
each pattern, with each CPU Resume but only clear the selected
Phase Edge Test flip-flop pair with a Mated External Phase Resume
•
Pause Test 1-2 Resume options:
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CPU Resume
o
Mated External Resume (there’s one for each Pause Test source)
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Pattern Delay Timer timeout
•
Phase Test 1-4 Resume options:
o
CPU Resume
o
Mated External Resume (there’s one for each Phase Test source)
o
Pattern Delay Timer timeout
Pause Examples:
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A Handshake example: Pause on Phase 4 FE (right after the output data
is formatted and before the input data is to be captured) of Sequence
Step 3 (a one pattern Sequence Step) and Resume on the Rising Edge of
Aux. 5:
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In Sequence Step 3, set the Pause Test Condition: Phase 4 FE
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Select for Resume Phase Test 4: Aux. 5
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Select for Resume Phase Test 4: Rising Edge Test Condition
•
Replicate a “Pattern Clutch” function using the Aux. 6 input (an active
high clutch):
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For all Sequence Steps within the Sequence, set the Pause Test
Condition: Pause Test 1 True
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Select for Pause Test 1: Aux. 6
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Select for Pause Test 1: High
Note: a “high” on Aux. 6 pauses and a “low” resumes (a Resume need
not be programmed in this case.)
•
Insert a 1s delay in one Pattern starting at the FE of Phase 4: